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BSC-GH-8
8 "probe station * High precision testing for various 8-inch semiconductor devices * Comfortable large handle drive CHUCK * 20X~4000X optical microscope amplification * No recoil force movement * Needle seat platform can be fine tuned for easy repositioning of probe card and microscope control. In the functional design of the probe station body, pneumatic lifting or tilting devices for the microscope have been added, making it more convenient to replace the objective lens and sample during the testing process, Avoided the issue of damaging the sample and lens
8 "Probe Station
Product model BSC-GH-8
Product Description
8 "large probe platform, suitable for sample testing and analysis within 8 inches;
PS: The probe station is a non-standard product and can be customized according to customer needs.
