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BSC-GM-6
The product model BSC-GM-6 of the 6 '' probe platform is suitable for testing samples within 6 inches (150mm); PS: The probe station is a non-standard product and can be customized according to customer needs.
*Suitable for high-precision testing of various semiconductor devices within 6 inches
*Coaxial drive CHUCK
*Can be upgraded for RF testing
*20X~2000X optical microscopy amplification
*No recoil movement
*You can choose between a microscope tilting device or a pneumatic lifting device
*Coaxial drive CHUCK
*Can be upgraded for RF testing
*20X~2000X optical microscopy amplification
*No recoil movement
*You can choose between a microscope tilting device or a pneumatic lifting device
